As automobiles advance to electrification, intelligence and networking, the demands for MCU chips of high safety, high reliability and high computing power are also growing rapidly. Compared with chips used in consumer electronics, automotive grade-level chips have higher requirements for stability and safety, which require collaboration with professional test equipment and test methods, as well as a longer test cycle. Currently, MCU design companies at home mainly cooperate with third-party testing organizations to complete the reliability test certification of chips, causing diffculties in coordination of resources and timeliness.

MindMotion’s automotive chip test and verification laboratory is constructed under the command of Chen Dawei, a member of the expert group of the former "CHI" (Core-electronics, High-end-general-Chips, and Infrastructural-software) key national project, engineer in-chief of China Electronics Standardization Institute, expert of the industrial control and automotive chip, and member of Shanghai Automotive Electronic Chip Localization Technology Expert Group. From the very beginning, the laboratory, according to the general requirements of the international testing and calibration laboratory (ISO/IEC 17025), was built with an international vision. Besides, tests conducted in our laboratory are based on the international automotive electronic component reliability standards (AEC-Q100/AEC-Q104). With the in-depth study and understanding of AEC-Q100, our laboratory carefully analyzed the 41 test requirements within seven categories in this standard and designed a full set of AEC-Q100 process in accordance with the characteristics of the laboratory and customer needs; with repeated practice, our tests on nearly 3000 samples in the full set of test items for automotive chip certification can be efficiently carried out in the shortest time and with the highest utilization rate. Meanwhile, with our professional and solid strength in MCU R&D, our laboratory testing engineers can cooperate with product designers effortlessly and smoothly to select key test items and related conditions, overcome key technical difficulties in testing to ensure that test procedures are reasonable and requirements for coverage rate of test vectors are satisfied, so as to continuously improve the quality and reliability of MindMotion’s products.

In the future, MindMotion’s automotive chip test and verification laboratory will work together with partners from upstream and downstream of the industrial chain to open up the technical and industrial channels for our automobile chips to be present in automotive applications and strive for the repleacement with domestic chips and expansion in the international market, boosting the vigorous development of domestic automotive chips!

1. Efficient and complete AEC-Q100H full project control process to ensure that the automobile test on samples are compliant with the standard

2. Strictly follow the requirements of AEC-Q100H. The real and original data records of all test projects and test conclusions of the project can be traced and customers are offered with "automotive product data package" service, which allows customers to query and trace the historical data of MindMotion’s products

3. Full temperature (-55~125 degrees) ATE electrical performance parameter testing capability allows the sample to undergo the strict testing analysis for electrical parameter degradation before and after the reliability test, offering scientific framework for judging the sample reliability test effect

4. Dynamic Burn-in/Testing HTOL environment of up to 10MHz real test vectors. MindMotion, through the coopeation with reliability test equipment suppliers, has developed the HTOL equipment, ensuring the landing of the dynamic brun-in/testing of up to 10 MHz real test vectors for MCU products

5. Based on the understanding of EMC, tests for automotive IC EMC test items which are more demanding than AEC-Q100H are carried out to better meet the needs from different customers for IC EMC

6. Provide complete PAT/DPAT and SBA screening test strategies and related data analysis that are compliant with the automotive grade level chips through our powerful semiconductor data analysis tools and professional data processing team